Optical characterization

NAPS


UCL Promotor : Alain Cornet

UCL Collaborators : Kamel Mallat, Kevin Contreras Villalobos

External collaborations :

Funding : Région Wallonne, DETROIT project

MEMS


Light has the capability to reveal tiny details of topography, structures, deformation.  We develop optical inspection  methods based on interferometry, deflectometry, polarization modulation.  Currently there are 3 ongoing projects :

  • Optical coherence tomography.

  • Deflectometry for the optical characterization of multifocal intraocular lens :  DETROIT project funded by the Région Wallonne.   

Optical coherence tomography

Optical coherence tomography (OCT) is a three-dimensional imaging technique that exploit the coherence property of light as such to achieve high resolution in the longitudinal direction.  We apply OCT for the dynamic chacterization of MEMS.  We also investigate possible improvements with a non linear detection, using femtosecond lasers.
 

Deflectometry

Deflectometry is an interesting alternative to interferometry.  It offers the ability to reconstruc with a high accuracy, the topography of a surface from the measurement of its gradients.  Measuring the deviation angle instead of the optical path has several advantages.  It is more effective in detecting local details and object contours than height measurement, it is insensitve  to vibrations as it is not based on interferences and it is does not require coherent light prone to noise pick up.  As such it is well adapted for the characterization of the surfaces of ophtalmic glasses.  This is the object of the DETROIT project funded by the Region Wallonne.