Petros GKOTSIS, Dr.

PhD
Sensors, Microsystems and Actuators Laboratory of Louvain (SMALL) 
Electrical Engineering Dpt. (ELEN)
Institute for Information and Communication Technologies, Electronics and Applied Mathematics (ICTEAM) 
Louvain School of Engineering (EPL)
Université catholique de Louvain (UCL)
Louvain-la-Neuve, Belgium

 

Office Address

B.014. Maxwell Building, Place du Levant 3
B-1348, Louvain-la-Neuve
Belgium

 

Contact Information

 

Tel(Fax): +32(0)10 47 39 96 (25 98)
Gilles Scheen160;
Web : http://www.uclouvain.be/Gilles.Scheen

Postal Adress : ELEN - Place du Levant 2 bte L5.04.04 à 1348 Louvain-la-Neuve 

Research Topic(s)

• MEMS reliability, material characterization, radiation effects
  

 

Latest relevant publications

•  Neutron and gamma radiation effects on MEMS structures. P. Gkotsis et al. Eurosensors XXV, September 4-7, 2011, Athens, Greece
  Mechanical characterization of thin film PZT using miniature tensile and bulge testing. P. Gkotsis et al. Piezo2011 Electroceramics for end-users March, 2011, Sestriere, Italy.
• Effect of adhesive wafer transfer processing on ferroelectric stacks with different top electrodes. P. Gkotsis et al. Piezo2011 Electroceramics for end-users March, 2011, Sestriere, Italy.
• Thin film crystal growth template removal: Application to stress reduction in lead zirconate titanate microstructures. P. Gkotsis et al. Applied Physics Letters, vol. 91, issue 16, 2007
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